Positron Beam Study of Co Doped ZnO Films Prepared by PLD
Slow positron beam are used to study defect structures in Co doped and undoped ZnO films prepared by Pulsed Laser Deposition (PLD) at 400°C, 600°C, 700°C on c-plane sapphire. Comparing with ZnO samples, Co doped ZnO samples have larger positron effective diffusion length (Leff), which change in different tendencies depending on the growth temperature. Crystal structures of the samples are investigated by X-ray diffraction (XRD) and wurtzite ZnO could be observed in Co doped samples.
S. J. Wang, Z. Q. Chen, B. Wang and Y. C. Jean
H. F. Ren et al., "Positron Beam Study of Co Doped ZnO Films Prepared by PLD", Materials Science Forum, Vol. 607, pp. 102-104, 2009