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HomeMaterials Science ForumMaterials Science Forum Vols. 62-64OH Diffusion - on the Measurement of Concentration...

OH Diffusion - on the Measurement of Concentration Profiles in Doped MCVD-Silica Layers Using a Color Center Laser

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Materials Science for High Technologies

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Periodical:

Materials Science Forum (Volumes 62-64)

Pages:

821-822

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.62-64.821

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Online since:

January 1991

Authors:

G. Braun, J. Kirchhof, P. Kleinert

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© 1991 Trans Tech Publications Ltd. All Rights Reserved

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