Analysis of Cu-Zr-Ag Amorphisable Alloys Produced by Centrifugal Casting

Dóra Janovszky; Mária Svéda; Kinga Tomolya; Jenő Sólyom; Norbert Hegman; András Roósz

doi:10.4028/www.scientific.net/MSF.649.75

Paper Titles

Phase Selection in Undercooled Melts of Peritectic Cu-Ge Alloys
p.47

Benefits of Modeling of Melting for the Understanding of Solidification Processes
p.53

In Situ Produced MMC Layer by Laser Melt Injection
p.61

Identification of Bulk Metallic Forming Compositions through Thermodynamic and Topological Models
p.67

Analysis of Cu-Zr-Ag Amorphisable Alloys Produced by Centrifugal Casting
p.75

Investigation of the Solidified Structure of Cu-Hf-Ti Alloys
p.81

Investigation of Amorphous/Crystalline State in Cu-Hf-Al Alloys
p.87

Analysis of Cu-Zr-Al Amorphisable Alloys Produced by Centrifugal Casting
p.93

Ni Content Surface Layer Produced by Laser Surface Treatment on Amorphisable Cu Base Alloy
p.101

HomeMaterials Science ForumMaterials Science Forum Vol. 649Analysis of Cu-Zr-Ag Amorphisable Alloys Produced...

Analysis of Cu-Zr-Ag Amorphisable Alloys Produced by Centrifugal Casting

Abstract:

Bulk Metallic Glasses (BMGs) have been widely investigated due to their excellent physical and chemical properties [1]. The copper based BMG occupies a special place in the family of BMGs since they are relatively low priced. The Cu-Zr-Ag ternary system has been examined on the basis of the ternary phase diagram [2]. We have changed the concentration of the alloys from the Cu58Zr42 to the concentration of the deep eutectic point. Wedge-shaped samples have been cast from the master alloys by centrifugal casting into a copper mould, consequently analyse the influence of the cooling rate on the crystallization. The cooling rate has been estimated from the secondary dendrite arm distances by using a Cu-Sn crystalline alloy. Near the tip of the wedge the samples were amorphous and near the base of the wedge the samples were fully or partially crystallized. The structures of the samples have been characterized by scanning electron microscope and X-ray diffraction.