Mismatch Simulation of Motion Detection Pointing Device

Bing Mo; Qi Zheng; Si Hao Chen; Su Ki Kim

doi:10.4028/www.scientific.net/MSF.704-705.1393

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Analysis on the Critical Buckling Stress in the TC4 Thin Plate Weldment
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Study on Manufacturing Process and Applying of Galvalume
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HomeMaterials Science ForumMaterials Science Forum Vols. 704-705Mismatch Simulation of Motion Detection Pointing...

Mismatch Simulation of Motion Detection Pointing Device

Abstract:

A motion detection pointing device based on CMOS image sensor is presented in this paper. Mismatch of active pixel sensor and correlated double sampling circuit is analyzed by Monte Carlo method using H-SPICE. With a 3.3V supply voltage, the maximal offset voltage caused by all mismatch is 3.6043mV, less than 8-bit least significant bit. Therefore, the motion detection pointing device system could achieve 8bit precision. The contribution of each mismatch to the total maximal offset voltage is also analyzed, comparison shows photo diode current mismatch and saturation drain current mismatch are the main causes of offset voltage. Keywords: mismatch; offset voltage; Monte Carlo method

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Periodical:

Materials Science Forum (Volumes 704-705)

Pages:

1393-1398

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.704-705.1393

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Online since:

December 2011

Authors:

Bing Mo, Qi Zheng, Si Hao Chen, Su Ki Kim

Keywords:

Mismatch, Monte-Carlo Method (MC-Method), Offset Voltage

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