Quantification of Phase Compositions Present in the System [(NiO)x].[(CoO)1-x].[(Al2O3)], 0.05 ≤ X ≤ 0.95, and the Effect in the Electrical Properties of Semiconductor as a Consequence of the CO+2 Variation

Keydson Quarema Gomes; Marcelo Bacelos; Pedro Iris Paulin Filho

doi:10.4028/www.scientific.net/MSF.727-728.550

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HomeMaterials Science ForumMaterials Science Forum Vols. 727-728Quantification of Phase Compositions Present in...

Quantification of Phase Compositions Present in the System [(NiO)_x].[(CoO)_1-x].[(Al₂O₃)], 0.05 ≤ X ≤ 0.95, and the Effect in the Electrical Properties of Semiconductor as a Consequence of the CO⁺² Variation

Abstract:

In this work were investigated the systems-NiO_x-CoO_1-x-Al₂O₃ using X-ray diffraction of the powder, which identified and quantified to phase in the sample was performed through the Rietveld method. The insertion of nickel oxide in the system obeyed the proportions of molar fraction of 0,05, 0,30, 0,50, 0,70 and 0,95 (x). Analyses were realized on samples which were treated at the temperature 1773K. From the results of refinement of spinel phase structure, was analyzed the relationship between lattice parameter refinement and the substitution of Co⁺² ion by Ni⁺²ion in the structure. The electrical resistivity dc was observed as a respect to temperature and the results appears a decrease of resistivity when were simultaneously increased the temperature. It was observed that the conduction mechanism was the same in all samples and the results for activation energy, characterized like electron hopping, it due exchange setting the ion Co⁺² D Co⁺³.