Diffractometer with a Curved PSD for Analysis of Polycrystalline Microsamples
p.339
p.339
X-Ray Diffractometric Sensors in Commercial Production
p.343
p.343
New Detectors in X-Ray Diffraction
p.349
p.349
Highly Stable Position-Sensitive Detectors for Powder Diffractometry
p.357
p.357
The INEL X-Ray Position Sensitive Detector: A Study of D-Spacing Accuracy and Exposure Time
p.363
p.363
A Two-Dimensional CCD-Based Detector for X-Ray Radiation
p.371
p.371
Analyser and P.S.D.: Energy Resolution Improvement
p.377
p.377
Physical Principles of X-Ray Storage Phosphors
p.383
p.383
Silicon Pin Photodiodes as Detectors with High Dynamical Range for X-Rays
p.389
p.389
The INEL X-Ray Position Sensitive Detector: A Study of D-Spacing Accuracy and Exposure Time
Abstract:
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Periodical:
Materials Science Forum (Volumes 79-82)
Pages:
363-370
Citation:
Online since:
January 1991
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Сopyright:
© 1991 Trans Tech Publications Ltd. All Rights Reserved
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