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HomeMaterials Science ForumMaterials Science Forum Vols. 79-82The Application of a...

The Application of a Proportional-Scintillation-Detector in X-Ray Diffractometry

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Periodical:

Materials Science Forum (Volumes 79-82)

Pages:

399-404

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.79-82.399

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Online since:

January 1991

Authors:

K. Richter, D. Meyer, J. Linz, K. Moras, W. Blau

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© 1991 Trans Tech Publications Ltd. All Rights Reserved

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