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Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry

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Abstract:

The paper deals with the study of optical properties of graphene oxide (GO) by inkjet printing. Defined structure of GO can be obtained by reducing of prepared layers either by heating or by UV radiation (rGO). The dispersion function for refractive index and extinction coefficient of GO and both rGO thin films were measured by spectroscopic ellipsometry in the wavelength range of 200 – 850 nm. Spectroscopic ellipsometry (SE) was used characterize the optical response of layer of GO reduced by UV and thermal reduction GO in visible range.

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Periodical:

Materials Science Forum (Volume 851)

Pages:

199-204

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.851.199

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Online since:

April 2016

Authors:

Veronika Schmiedová, Jan Pospisil, Oldrich Zmeskal, Viliam Vretenar

Keywords:

Graphene Oxide, Optical Properties, Spectroscopic Ellipsometry

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© 2016 Trans Tech Publications Ltd. All Rights Reserved

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References

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