Cesium Surface Atoms: XPS Comparison between GIC Surfaces and Thin Layers Deposited on Graphite

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Periodical:

Materials Science Forum (Volumes 91-93)

Edited by:

D. Tchoubar and J. Conard

Pages:

703-708

DOI:

10.4028/www.scientific.net/MSF.91-93.703

Citation:

H. Estrade-Szwarckopf et al., "Cesium Surface Atoms: XPS Comparison between GIC Surfaces and Thin Layers Deposited on Graphite", Materials Science Forum, Vols. 91-93, pp. 703-708, 1992

Online since:

January 1992

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$35.00

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