Synchrotron White Beam X-Ray Topographic In Situ Study of the Different Types of Grain Growth

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Periodical:

Materials Science Forum (Volumes 94-96)

Edited by:

G. Abbruzzese and P. Brozzo

Pages:

17-26

DOI:

10.4028/www.scientific.net/MSF.94-96.17

Citation:

J. Gastaldi et al., "Synchrotron White Beam X-Ray Topographic In Situ Study of the Different Types of Grain Growth ", Materials Science Forum, Vols. 94-96, pp. 17-26, 1992

Online since:

January 1992

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$35.00

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