Grain Boundary Character Distribution (GBCD) Analysis of Grain Growth-Related Phenomena in Polycrystalline Materials
p.209
p.209
On the Mechanisms of Grain Boundary Migration
p.221
p.221
Experimental Aspects of the Electron Back-Scatter Diffraction Technique for Grain Boundary Characterisation
p.233
p.233
Experimental and Theoretical Aspects of Grain Growth in Thin Films
p.245
p.245
Some Topological Aspects in 2-D Grain Structures
p.259
p.259
Main Regularities of 2-D Normal Grain Growth
p.269
p.269
The Topology of a Polycrystal in Three Dimensions
p.275
p.275
Grain Growth on Curved Surfaces
p.281
p.281
3-D and 2-D Stereological Parameters of Computer Simulated Grain Structures
p.285
p.285
Some Topological Aspects in 2-D Grain Structures
Abstract:
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Periodical:
Materials Science Forum (Volumes 94-96)
Pages:
259-268
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Online since:
January 1992
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© 1992 Trans Tech Publications Ltd. All Rights Reserved
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