Summary of the Discussion Session on Atomic Scale Probes for Investigation of Defects and Defect Clusters

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 97-99)

Edited by:

G. Szenes

Pages:

775-778

Citation:

C.A. English, "Summary of the Discussion Session on Atomic Scale Probes for Investigation of Defects and Defect Clusters ", Materials Science Forum, Vols. 97-99, pp. 775-778, 1992

Online since:

January 1992

Authors:

Export:

Price:

$38.00