Crystallographic Phase Composition and Structural Analysis of Ti-Ni-Fe Shape Memory Alloy by Synchrotron Diffraction

Abstract:

The preferred crystallographic orientation (i.e. texture) and the non-transformed austenite can cause serious systematic errors in the structural study of the R-phase in 50.75at.%Ti- 47.75at.%Ni-1.50at.%Fe (hereafter referred to as Ti-Ni-Fe ternary) shape memory alloy. The crystal structure refinement of R-phase synchrotron high resolution powder diffraction (SRD) data using Rietveld refinement with generalized spherical harmonic (GSH) description for preferred orientation correction showed that the sample consists of minor cubic phase and the space group was 3 P [1]. The objective of the present paper is to study the crystallographic phase composition and crystal structure refinement of SRD data of trigonal R-phase martensite and monoclinic (B19¢) martensite in Ti-Ni-Fe ternary alloy during thermal cycling using the GSH description.

• Periodical: Solid State Phenomena (Volume 105)
• Pages: 139-144
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.105.139
• Online since: July 2005
• Authors: H. Sitepu, Heinz Günter Brokmeier, Daniel Chateigner, J.P. Wright
• Keywords: Generalized Spherical Harmonic (GSH) Description, Monoclinic (B19 ') Martensite, Rietveld Refinement, Synchrotron High Resolution Powder Diffraction SRD, Trigonal R-Phase Martensite

References

[1] H. Sitepu: Texture and Microstructures Vol. 35 (2003), p.185.

[2] K. Otsuka and C.M. Wayman: Shape Memory Materials (Cambridge University Press, Cambridge, 1998).

[3] T. Hara, T. Ohba and K. Otsuka: J. de Physique III Vol. 5 (1995), p.641.

[4] T. Hara, T. Ohba, E. Okunishi and K. Otsuka: Mater. Trans. JIM Vol. 38 (2007), p.11.

[5] H. Sitepu: J. Appl. Cryst. Vol. 35 (2002) p.274.

[6] H.J. Bunge: Texture Analysis in Materials Science (Butterworths, London 1982).

[7] N.C. Popa: J. Appl. Cryst. Vol. 25 (1992), p.611.

[8] R.B. Von Dreele: J. Appl. Cryst. Vol. 30 (1997) p.517.

[9] H. Sitepu, W.W. Schmahl and R.B. Von Dreele: Appl. Phys. A Vol. 74 (2003), p. S1676.

[10] H. Sitepu, W.W. Schmahl and J.K. Stalick: Appl. Phys. A Vol. 74 (2003), p. S1919.

[11] A.C. Larson and R.B. Von Dreele: General structure analysis system (GSAS) (Los Alamos National Laboratory Report LAUR, 2000).

[12] N.C. Popa: J. Appl. Crys. Vol. 31 (1998), p.176.

[13] P.W. Stephens: J. Appl. Cryst. Vol. 32 (1999), p.281.

[14] D. Schryvers and P.L. Potapov: Materials Trans. Vol. 43 No. 5 (2002), p.774.