Microstructure and Properties of (Tb,Sm)CoSi/Cr Series Thin Films for Permanent Magnets

Abstract:

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The microstructures and properties of (Tb,Sm)CoSi/Cr series films have been investigated. All the samples were sputtered and annealed at 500 °C for 25 min in pure N2 atmosphere, and their microstructures and properties were examined. The effect on the magnetic properties of partial Sm substituted by Tb is discussed. The lattice matching media were examined. And the mechanisms of interactions among the grains and between the magnetic layers have been analyzed by comparing multi magnetic layer with the mono magnetic layer.

Info:

Periodical:

Solid State Phenomena (Volumes 121-123)

Edited by:

Chunli BAI, Sishen XIE, Xing ZHU

Pages:

267-270

DOI:

10.4028/www.scientific.net/SSP.121-123.267

Citation:

X. Wang et al., "Microstructure and Properties of (Tb,Sm)CoSi/Cr Series Thin Films for Permanent Magnets", Solid State Phenomena, Vols. 121-123, pp. 267-270, 2007

Online since:

March 2007

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Price:

$35.00

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