On the Modelling of Diffraction Line Profiles from Nanocrystalline Materials

Abstract:

Recent advances in Line Profile Analysis of powder diffraction patterns must be paralleled by increasing attention to the quality and quantity of experimental data. The analysis of simulated data with different noise levels demonstrates the importance of statistical quality to reveal fine details of interest in the analysis of nanocrystalline materials, like the crystallite shape. It is also shown how synchrotron radiation diffraction can improve data quality with respect to laboratory measurements, both in terms of statistical quality and in terms of accessible information.

• Periodical: Solid State Phenomena (Volume 163)
• Pages: 19-26
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.163.19
• Online since: June 2010
• Authors: Paolo Scardi, Matteo Leoni, D. Dodoo-Arhin
• Keywords: Line Profile Analysis, Nanocrystalline Material, Powder Diffraction, Whole Powder Pattern Modelling, X-Ray Diffraction (XRD)

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