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Microstructure and Lattice Parameter Studies of Constituent Phases in CoSi2-Si Eutectic Composite

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Abstract:

The subject of the study was an examination of the lattice parameter variations of the constituent phases in CoSi2-Si eutectic composite according to the vertical axes of samples. A preparation of samples has been conducted using Bridgman and Czochralski techniques. The aim of the study was to establish an influence of applied preparation method on a stability of appropriate lattice parameters. It was shown that the constituent phases of the CoSi2-Si eutectic samples obtained via Czochralski technique are distinguished by a higher stability of the lattice parameter than samples obtained using Bridgman technique.

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Applied Crystallography XXI View Preview

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Periodical:

Solid State Phenomena (Volume 163)

Pages:

268-271

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.163.268

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Online since:

June 2010

Authors:

Krzysztof Szostek, Wojciech Gurdziel, Zygmunt Wokulski

Keywords:

Bridgman Technique, CoSi2-Si Eutectic, Czochralski Technique, Lattice Parameter, Metal-Semiconductor Composites

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