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Sequential Phase Formation during Reactive Diffusion of a Nanometric-Thick Mn Film on Ge(111)

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Abstract:

In recent years, spintronics whose principle is based on controlling the spin of electrons in semiconductor layers is presented as a complementary or even an alternative solution for production of logic devices in microelectronics. It relies on the fact that electric current in a magnetic layer can be spin polarized. Manufacture of such components is based on the use of materials or heterostructures whose electronic properties depend on their magnetic state. The magnetic Mn-Ge system is interesting because of its possible development at high Curie temperature and its integration on Si substrate. Among all of the Mn-Ge phase compounds of the diagram, Mn5Ge3 seems the most interesting one for spintronics applications: it is a stable and ferromagnetic phase at room temperature. In this paper, we present first results of the study, by Reflection High Energy Electron Diffraction (RHEED), X-ray diffraction (XRD) and Atomic Force Microscopy (AFM), of the sequence of formation of the MnxGey phases in the case of reaction of a nanometric-thick Mn film (200nm) deposited by MBE on Ge (111).

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Periodical:

Solid State Phenomena (Volumes 172-174)

Pages:

579-584

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.172-174.579

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Online since:

June 2011

Authors:

Omar Abbes, Feng Xu, Alain Portavoce, Khalid Hoummada, Vinh Le Thanh, Christophe Girardeaux

Keywords:

AFM, Mn-Germanides, Reactive Diffusion, RHEED, Solid-State Reaction, X-Ray Diffraction (XRD)

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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