Study of Structure and Strain in Au/Cu Systems Using Molecular Dynamics Simulation: X-Ray Scattering Analysis

Dariusz Chocyk; Tomasz Zientarski

doi:10.4028/www.scientific.net/SSP.203-204.142

Paper Titles

Low-Temperature XRD Study of Phase Transformations in NiTi and TiNiCo Shape Memory Alloys Used for the Preparation of the Prototypes of Medical Implants
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XRD Based Methods of Investigation the Order - Disorder Transformation in the Spinel Structure - A Comparative Study
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Microstructure of Ni/Al₂O₃ Electrodeposited Coatings Studied with XRD and SEM Techniques
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Study of Fe₇₅Al₂₅ Alloys by the Mössbauer Spectroscopy Positron Annihilation Lifetime Spectroscopy (PALS), XRD and SEM
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Study of Structure and Strain in Au/Cu Systems Using Molecular Dynamics Simulation: X-Ray Scattering Analysis
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X-Ray Analysis of New Gadolinium Doped CuCr₂Se₄
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The Comparative Study of Phase Composition of Steels Using X-Ray Diffraction and Mössbauer Spectroscopy Methods
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Quantitative X-Ray Phase Analysis as a Method of Control of Iron Blende Roasting Process
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Molecular Dynamics Study of Adatom Size Effect on Stress Evolution in Lennard-Jones Thin Films: X-Ray Scattering Analysis
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HomeSolid State PhenomenaSolid State Phenomena Vols. 203-204Study of Structure and Strain in Au/Cu Systems...

Study of Structure and Strain in Au/Cu Systems Using Molecular Dynamics Simulation: X-Ray Scattering Analysis

Abstract:

The aim of this work is to investigate structure and stress evolution in Au/Cu bilayer systems during deposition. The approach used here is based on an embedded atom method (EAM). interatomic potential database for different metal elements, their alloys and multilayers. We applied the kinematical scattering theory to calculate the X-ray scattering profiles. In this case the X-ray scattering techniques are used for the structural characterization of crystal structures obtained from simulation data. This method was applied to determine the lattice parameters in any directions. The lattice parameters in deposited layers were directly determined by the analysis of X-ray diffraction profiles. Results shows that on the interface of Au/Cu system, the crystalline lattice of Au layer is fitted to crystalline lattice of Cu layer. We found that deformation of the crystal lattice near the interface has a major influence on the stress.