Rietveld Analysis of Aurivillius-Type Structure Ceramics Synthesized from Precursors Prepared by Classical and HEBM Methods

Abstract:

The aim of this study was to analyze the influence of the method of preparing the substrates in the form of simple oxides for the structure of the final Bi₅Ti₃FeO₁₅ ceramics. Milling of the substrates was carried out by two methods: the classical one by hand mixing in a porcelain mortar, and by high-energy. Structure studies were performed by the X-ray diffraction (XRD) method. XRD patterns were analyzed with the Rietveld method using the DBWS 9807a program. It was found out that the slightest deviation of the network parameters from the catalog data occurs for the sample obtained from simple oxides by free sintering (BTFs). Furthermore, it was also determined that the optimal high-energy time of the substrates is 5 hours. When compared to the ICDD catalog data, the resulting ceramics is a single phase one and has the lowest network parameters deviation among all samples which were subject to high-energy.

• Periodical: Solid State Phenomena (Volumes 203-204)
• Pages: 319-322
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.203-204.319
• Online since: June 2013
• Authors: Jolanta Dercz, Grzegorz Dercz, Krystian Prusik, Rafał Babilas
• Keywords: Aurivillius Phase, Bismuth Titanate, High-Energy Milling, Multiferroic Ceramics, SEM, TEM, X-Ray Diffraction (XRD)

References

[1] M. Mahesh Kumar, V. R. Palkar, K. Srinivas, S. V. Suryanarayana, Appl. Phys. Lett. 76, (2006), p.2764

[2] A. P. Douvalis, M. Venkatesan, P. Velasco, C. B. Fitzgerald, J.M.D. Coey, J. Appl. Phys. 93, (2003), p.8071

[3] G.A. Smolenskii, V.A. Isupov, A.I. Agranovskaja, Fiz. Tverd. Tela, 1, (1959), p.169

[4] X.Y. Zhang, J.Y. Dai, Sol. St. Chem, 33, (2005), p.147

[5] Aurivillius, Arkh. Khemi. 1, (1949), p.499

[6] Aurivillius, Arkh. Khemi. 2, (1950), p.512

[7] G. Dercz, J. Dercz, K. Prusik, A. Hanc, L. Pająk, J. Ilczuk, Arch. Metall. Mater. 54, (2009), p.741

[8] E.C. Subbarao, Bull. Am. Phys. Soc. 5, (1960), p.423

[9] E.C. Subbarao, J. Chem. Phys. 34, (1961), p.695

[10] L.G. Van Uitert, L.Egerton, J. Appl. Phys. 32, (1961), p.959

[11] S.F. Cummins L.E. Cross, J. Appl. Phys. Lett. 10, (1967), p.14

[12] F. Jona, G. Shirane, Ferroelectric crystals, (Pergamon Press, Oxford, 1962)

[13] M.I. Morozov, L.P. Mezentseva, and V.V. Gusarov, Russ. J. Gen. Chem. 72, (2002), p.1038

[14] J. Dercz, G. Dercz, K. Prusik, B. Solecka, A. Starczewska, J. Ilczuk, Int. J. Thermophys. 31 (2009), p.42

DOI: 10.1007/s10765-009-0691-2

[15] J. Dercz, A. Starczewska, G. Dercz, Int. J. Thermophys. 32, (2011), p.746

[16] K. Sunahara, J. Yano, K. Kakegawa, J. Europ. Cer. Soc. 26, (2006), p.623

[17] Machura, J. Rymarczyk, J. Ilczuk, Europ. Phys. J. 154, (2008), p.131

[18] R. Takahashi, Y. Yonezawa, M. Ohtani, M. Kawasaki,Y. Matsumoto, H. Koinuma, Appl. Surf. Sci. 252, (2006), p.2477

[19] C. Subbarao, J. Am. Ceram. Soc. 45, (1962), pp.1-66.

[20] H.M. Rietveld, J. Appl. Cryst. 3 (1969), p.65

[21] R.A. Young, D.B. Wiles, Adv. in X-Ray Anal. 24 (1980) p.1

[22] R.A. Young, The Rietveld method, (Oxford University Press, 1993)

[23] T. Rzychoń, A. Kiełbus, G. Dercz, Sol. St. Phenom. 163 (2010), p.169

[24] R.J. Hill, C.J. Howard, J. Appl. Cryst. 20 (1987), p.467

[25] G. Dercz, D. Oleszak, K. Prusik, L. Pająk, Rev. Adv. Mater. Sci. 8 (2008), p.764