Hybrid Expert System for Diagnosing MOS Transistors

Józef Drabarek

doi:10.4028/www.scientific.net/SSP.210.186

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HomeSolid State PhenomenaSolid State Phenomena Vol. 210Hybrid Expert System for Diagnosing MOS...

Hybrid Expert System for Diagnosing MOS Transistors

Abstract:

This article presents a hybrid expert system which consists of a symbolic expert system and a genetic algorithm being connected to it. When a fault location diagnosis is not correct or the symbolic expert system is not able to locate a fault due to the lack of knowledge, the user may use the knowledge of the genetic algorithm. A MOS transistors were chosen as the object of diagnosing for the purpose of testing of the hybrid expert system.

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Periodical:

Solid State Phenomena (Volume 210)

Pages:

186-191

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.210.186

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Online since:

October 2013

Authors:

Józef Drabarek

Keywords:

Diagnostics, Fault Location, Genetic Algorithm (GA), Symbolic Expert System

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