Analysis of Crystallite Size Changes in an Oxide Layer Formed on Steel during Long-Term Operation at an Elevated Temperature

Abstract:

The paper presents results of studies on the crystallite sizes of oxide layer formed during a long-term operation on steel operated for a long time at an elevated temperature. This value was determined by a method based on analysis of the diffraction line profile, according to a Scherrer formula. X-ray studies were carried out on the inner surface of a tube (in a flowing medium environment), then the layer’s surface was polished and the diffraction measurements repeated to reveal differences in the originated oxides layer. X-ray phase analysis was performed using a SEIFFERT 3003 T/T X-ray diffractometer, with a cobalt tube of λ_Co = 0.17902 nm wavelength. XRD measurements were performed in the 15÷120° range of angles with an angular step of 0.1° and the exposure time of 4 s. To interpret the results (to determine the 2θ position and the total intensity I_Net) the diffractograms were described by a Pseudo Voight curve using the Analyze software. A computer software and the PDF4+2009, DHN PDS crystallographic database were used for the phase identification.

• Periodical: Solid State Phenomena (Volume 227)
• Pages: 381-384
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.227.381
• Online since: January 2015
• Authors: Monika Gwoździk*
• Keywords: Crystallite Sizes, Oxide Layer, XRD

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