Morphological Instabilities in Bilayers Incorporating Polycristalline Silicon

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Periodical:

Solid State Phenomena (Volumes 23-24)

Edited by:

G. Martin and L.P. Kubin

Pages:

81-86

DOI:

10.4028/www.scientific.net/SSP.23-24.81

Citation:

S. Nygren and F. M. d'Heurle, "Morphological Instabilities in Bilayers Incorporating Polycristalline Silicon", Solid State Phenomena, Vols. 23-24, pp. 81-86, 1992

Online since:

January 1992

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$35.00

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