Structural and Magnetic Properties of Ni50Mn35In15 Thin Films

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Abstract:

We present the results of macroscopic measurements, X-ray diffraction and neutron reflectivity experiments on ≈ 25 nm thin films of Ni50Mn35In15 grown using Pulsed laser deposition technique on MgO single-crystalline substrate. Intrinsic magnetization of the film below Tc ≈ 290 K was confirmed. Structural measurements show the large temperature-dependent residual strain on the substrate with no indication of martensitic transition.

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Solid State Phenomena (Volumes 233-234)

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666-669

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July 2015

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© 2015 Trans Tech Publications Ltd. All Rights Reserved

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