Microstructure Control by Cold Working-Annealing in the Alumina Thin Wiring

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Periodical:

Solid State Phenomena (Volumes 25-26)

Main Theme:

Edited by:

A.C.D. Chaklader and J.A. Lund

Pages:

635-0

DOI:

10.4028/www.scientific.net/SSP.25-26.635

Citation:

X.M. Chen et al., "Microstructure Control by Cold Working-Annealing in the Alumina Thin Wiring ", Solid State Phenomena, Vols. 25-26, pp. 635-0, 1992

Online since:

January 1992

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Price:

$35.00

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