Characterization of Vanadium Zinc Carbide Saturable Absorber for Ultrafast Laser Applications

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This study reports the synthesis and comprehensive characterization of V2ZnC-PVA saturable absorbers (SAs) fabricated via solution-casting methods. The thin films were examined for their structural, chemical, and optical properties to evaluate their suitability for ultrafast photonic applications. Surface morphology and thickness were assessed using field emission scanning electron microscopy (FESEM) and 3D laser scanning microscopy, while elemental composition and crystallinity were confirmed through energy-dispersive X-ray spectroscopy (EDX) and X-ray diffraction (XRD). Raman spectral analysis, through its molecular vibration signatures, verified both the preservation of the MAX-phase structure and the overall stability of the films. Optical characterization revealed distinct behaviours: linear absorption measurements confirmed high transparency with adjustable absorption profiles, whereas nonlinear experiments conducted with a twin-balanced detector demonstrated pronounced saturable absorption, achieving modulation depths above 12 % and saturation intensities in the order of kW·cm-2. Together, these findings demonstrate that V2ZnC-PVA saturable absorbers are suitable for ultrafast photonics, especially in passive Q-switching and mode-locking, because of their strong nonlinear response, uniform morphology, and superior resistance to optical damage with a high damage threshold.

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Solid State Phenomena (Volume 394)

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9-14

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June 2026

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© 2026 Trans Tech Publications Ltd. All Rights Reserved

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