Composition of (Bi2S3)1-x(CdS)x Semiconductor Thin Films by Proton Induced X-Ray Emission and Helium Backscattering

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Periodical:

Solid State Phenomena (Volume 55)

Edited by:

R.M. Mehra and P.C. Mathur

Pages:

215-217

DOI:

10.4028/www.scientific.net/SSP.55.215

Citation:

S. Misra "Composition of (Bi2S3)1-x(CdS)x Semiconductor Thin Films by Proton Induced X-Ray Emission and Helium Backscattering", Solid State Phenomena, Vol. 55, pp. 215-217, 1997

Online since:

August 1997

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