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HomeSolid State PhenomenaSolid State Phenomena Vol. 55Composition of (Bi2S3)1-x(CdS)x Semiconductor Thin...

Composition of (Bi₂S₃)_1-x(CdS)_x Semiconductor Thin Films by Proton Induced X-Ray Emission and Helium Backscattering

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Semiconductor Materials and Technology (ICSMT)

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Periodical:

Solid State Phenomena (Volume 55)

Pages:

215-217

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.55.215

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Online since:

August 1997

Authors:

S. Misra

Keywords:

(Bi₂S₃)_1-x(CdS)_x Thin Film, Composition, Proton Induced X-Ray Emission (PIXE), Rutherford Backscattering (RBS)

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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