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All diffraction peaks can be indexed to the hexagonal wurtzite structure ZnO and diffraction date were in agreement with JCPDS card of ZnO (JCPDS 36-1451).
It clearly reveals that the product is primarily composed of nanorods with mean diameters of about 80 nm and lengths of 100-400 nm, indicating that ZnO nanorods can be obtained by this method though a small number of nanoparticles were observed. .

There are larger numbers of pores on the surface of FePO4·3H2O microspheres, which are important to synthesize high performance LiFePO4 cathode materials for the application of lithium ion battery.
XRD pattern shown in Fig.2b confirms that all the diffraction peaks for the a- FePO4·3H2O sample match well with the Hexagonal crystalline FePO4 phase with lattice constant a = 5.035 Å, b = 5.035 Å, and c = 11.245 Å, which is good agreement with the literature value (JCPDS card no.29-0715).
The XRD pattern of LFP/C sample synthesized by b-FePO4·3H2O shows a series of diffraction peaks that can be indexed to the orthorhombic structure (JCPDS card no.40-1499).
Additionally, each of the micro-sphere particles is made up of a large number of small grains, as shown in Fig.3 (b) and (d).
The amorphous spherical FePO4·3H2O particles with larger numbers of pores on the surface will be favorable for the production of LFP/C, which retained the morphology of FePO4·3H2O precursor.

The thickness of shells could be easily controlled by changing the number of deposition cycles (50 nm for four deposition cycles).
The PL intensity of Eu3+ increases with the number of coating cycles.
For SiO2 particles annealed at 700 ◦C, no diffraction peak is observed except for a broad band centered at 2θ = 22.00◦, which is the characteristic peak for amorphous SiO2 (JCPDS 29-0085).
particles annealed at 700 ◦C, apart from the broad band from amorphous SiO2 (2θ = 22.00◦), diffraction peaks at 2θ = 20.91◦ (211), 29.75◦(222), 34.49◦ (400), 44.42◦ (431), 49.56◦ (440), and 58.88◦ (622) are present, all of which can be indexed to pure Lu2O3 phase (JCPDS Card 21-1274).

Other electrical parameters (carrier concentration np = 10.04x1018 cm-3, electrical resistivity ρ = 30.49x10-2 Ω cm and mobility μH = 94.33 cm2/V s) were measured at room temperature. 1.Introduction In the past 30 years, the number of research works on thin film devices for solar energy applications increased significantly [1-7].
The spectra correspond to the standard JCPDS (03-65-4145) card file pattern for cubic Cu2SnSe3 phase with the F43m space group.
These data confirm the cubic structure of Cu2SnSe3 (JCPDS Card No. 03-065-4145).
Low intensity peak situated at 2θ value of 44.49º, is in agreement with the Cu3Sn phase (JCPDS No. 03-065-9057 card), and those located at 52.78º and 64.90º, fit well with the SnSe (JCPDS No. 36-1042) secondary phase.

The positions and relative intensities of all the main diffraction patterns and the characteristic reflections, such as (220), (311), (222), (400), (422), (511), and (440), as well as the calculated lattice parameters are in agreement with those in the standard XRD card (JCPDS10-325) of Ni-ferrite.
(Fig. 2) However, the peak intensity of the particles differed from the JCPDS card.
In the lattice of nickel ferrite with a completely inverse spinel structure, an equal number of the Fe 3+ ions at the Td and Oh sites respectively [3].

The chemical oxygen demand (COD) with N-TiO2 film photocatalyst experiment by degrading pesticide phoxim in aqueous solution under UV light by a self-design circulating photoreactor indicated that the degradation efficiency of N-TiO2 film photo catalyst was depended on the layer numbers, flow velocity of solution and the category of light sources.
The diffraction peaks (from Fig. 1a to d )of samples could be indexed to pure anatase phase of TiO2 according to JCPDS card no. 89-4921.
The effects of layer numbers of film catalyst, flow velocity of solution and the luminous sources on COD photodegradation were studied in a self-design circulating photoreactor.

According to the Fig.1 (b) and inquiring the standard card, YFeO3-600 and YFeO3-700 have slightly mixed phase.
It was found that single phase YFeO3 of perovskite structure with excellent crystallinity was obtained after 800 ℃ calcination, according to the JCPDS card number 73-1345.

So far a number of methods have been reported to produce synthetic Ca-Ps, for example, solution processes, hydrothermal systems, bio-mimetic systems and sol-gel methods.
The diffraction peaks in the patterns of Fig. 1a, 1b and 1c are identified as those of DCPD, DCPA and HA, respectively, based on data in the standard cards (JCPDS No. 72-0713, No. 75-1520 and No. 74-0566, respectively).
The diffraction pattern of Fig. 1a did not contain any peaks other than those shown in the card for DCPD.

Peak positions and relative intensities for the Zn/ZnO core-shell structure were compared to values from Joint Committee on Powder Diffraction Standards (JCPDS) card for ZnO (JCPDS PDF #36-1451) and for Zn (JCPDS PDF #04-0831).
Acknowledgements This work was financially supported by the grant from Changzhou University under the contraction number ZMF1002132.

The 2θ values obtained were compared to data files from the Joint Committee on Powder Diffraction Standards (JCPDS).
The hkl parameters of the CuO-ZnO thin film are determined using the JCPDS Card.
The XRD peaks match the reported diffraction pattern of CuO with a monoclinic structure (JCPDS card # 80-1917).
Similarly, diffraction peaks for ZnO having a hexagonal structure match well with the reported XRD pattern (JCPDS card # 36- 1451).
High porosity, voids, and trapezium-shaped grains are also available in large numbers, and a more effective surface area has been observed for oxygen species adsorption.