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Online since: December 2016
Authors: Geun Su Joo, Hoon Huh
Fig. 6 shows fitted true stress−true strain curves by using the Chun et al. model at various strain rates.
Fig. 6 Tension/compression loading curves of the TRIP980 steel sheet fitted by the Chun et al. model at each strain.
The fitted curves with the Chun et al. model show a good prediction with experimental data at all strain rate conditions.
In order to approximate the obtained curves, the Chun et al. model, a modified form of the Chaboche model, is utilized.
Tendencies of the material parameter in the Chun el al model are investigated with respect to the strain rate.
Fig. 6 Tension/compression loading curves of the TRIP980 steel sheet fitted by the Chun et al. model at each strain.
The fitted curves with the Chun et al. model show a good prediction with experimental data at all strain rate conditions.
In order to approximate the obtained curves, the Chun et al. model, a modified form of the Chaboche model, is utilized.
Tendencies of the material parameter in the Chun el al model are investigated with respect to the strain rate.
Online since: September 2015
Authors: S.B. Arya, Ankit Kanaujia
Presences of Al improve the corrosion properties and mostly added to approximately 2-9%.
Table 1: Chemical composition of AZ91D Mg Alloy Alloy Al Zn Mn Si Cu Fe Ni Other Mg Wt% 8.77 0.63 0.22 0.10 0.030 0.005 0.002 0.02 Balance Fig. 1: Microstructure of AZ91D alloy (black region shows the α phase and white region shows the β phase Results discussions Role of Chlorides ions: The microstructure of AZ91D Mg alloy (as received) is shown in figure 1, which is consist of α-phase matrix(black) and second phase precipitates as β phase(white), which is predominantly at the grain boundaries[4].
[5] Badawy Waheed A., Hilal Nadia H., Mohmmed El-Rabiee, Nady H. (2009).
Table 1: Chemical composition of AZ91D Mg Alloy Alloy Al Zn Mn Si Cu Fe Ni Other Mg Wt% 8.77 0.63 0.22 0.10 0.030 0.005 0.002 0.02 Balance Fig. 1: Microstructure of AZ91D alloy (black region shows the α phase and white region shows the β phase Results discussions Role of Chlorides ions: The microstructure of AZ91D Mg alloy (as received) is shown in figure 1, which is consist of α-phase matrix(black) and second phase precipitates as β phase(white), which is predominantly at the grain boundaries[4].
[5] Badawy Waheed A., Hilal Nadia H., Mohmmed El-Rabiee, Nady H. (2009).
Online since: November 2010
Authors: Gang Xiong
J.W.Choi et al. [1,2]have reported on Ti4+, Sn4+ and Zr4+ B-site substitution in Ca(Li1/3Nb2/3)O3-δ ceramics.
The τf value of CSLNZ specimens increased with the decrease of the Tolerance factor (t).The τf can be related to the Tolerance factor (t) of the ABO3 perovskite structure according to the work of Reaney al[5].
Reaney, E.L.
The τf value of CSLNZ specimens increased with the decrease of the Tolerance factor (t).The τf can be related to the Tolerance factor (t) of the ABO3 perovskite structure according to the work of Reaney al[5].
Reaney, E.L.
Online since: May 2004
Authors: G. Özen, M. Lutfy Öveçoğlu, V. Kalem, M.R. Özalp, F. Altın
Nukui et. al have
studied crystallization of zinc-tellurite glasses with different compositions by DTA, and identified
the crystallized phases by X-ray diffraction [5].
Bürger et. al.: J.
[7] R.El-Mallawany : J.
Bürger et. al.: J.
[7] R.El-Mallawany : J.
Online since: October 2010
Authors: Leonidas C. Palilis, Dimitra G. Georgiadou, Panagiotis Argitis, George Papadimitropoulos, Nikolaos A. Stathopoulos, Agis Iliadis, Nikolaos Konofaos, Dimitris Davazoglou, Maria Vasilopoulou, Ioannis Kostis
Generally, in OLEDs based on conjugated polymers (termed as PLEDs), the injection of electrons is more difficult than that of holes due to the large injection barrier present when high work function stable cathode electrodes such as Al or Ag are used.
Finally, thermal evaporation of a 200 nm thick aluminium (Al) cathode completed device fabrication.
Dark and Photo-current density-voltage (J-V) characteristics were measured with a Keithley 2400 source-measure unit while luminance and electroluminescence (EL) spectral characteristics were recorded with an Ocean Optics spectrophotometer equipped with fiber optics, assuming a Lambertian emission profile (for the luminance measurements).
Furthermore, the interaction of Al with reduced WO3 may also be responsible for creating gap states upon electron transfer from Al to WO3 and filling them with electrons.
Note, that the use of a similar thickness reduced WOx layer at the polymer/Al interface results in a shunted device.
Finally, thermal evaporation of a 200 nm thick aluminium (Al) cathode completed device fabrication.
Dark and Photo-current density-voltage (J-V) characteristics were measured with a Keithley 2400 source-measure unit while luminance and electroluminescence (EL) spectral characteristics were recorded with an Ocean Optics spectrophotometer equipped with fiber optics, assuming a Lambertian emission profile (for the luminance measurements).
Furthermore, the interaction of Al with reduced WO3 may also be responsible for creating gap states upon electron transfer from Al to WO3 and filling them with electrons.
Note, that the use of a similar thickness reduced WOx layer at the polymer/Al interface results in a shunted device.
Online since: February 2012
Authors: Jing Hao Chen, Jian Zhang, Meng Lan Duan
Wang et al developed a novel numerical model for analyzing pipeline in the S-lay problem [5].
Yan et al established the calculation method of shear stresses between each layer of thermal insulation pipe [6].
Gong et al established mechanical model of S-lay by divided the pipe into three segments.
Gong et al analyzed the effect of various parameters on the tension of tensioner and ultimate laying water depth [8].
Andrzej, E.L.
Yan et al established the calculation method of shear stresses between each layer of thermal insulation pipe [6].
Gong et al established mechanical model of S-lay by divided the pipe into three segments.
Gong et al analyzed the effect of various parameters on the tension of tensioner and ultimate laying water depth [8].
Andrzej, E.L.