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FT-IR of the complex was performed on a BIO-RAD FTS135 Fourier-transform infrared (FT-IR) spectrometer using the KBr pellet technique with a wave number range of 4000-400 cm-1.
Element analysis data (the theoretical calculation number is included in the brackets ): C, 39.62% (39.48%); H, 2.36% (2.09%); N, 4.51% (4.19%); Eu, 30.14% (30.30%).
The diffraction peak positions, peak intensities and lattice distance of the complex are totally different from those of H4L (No. 13-882 in JCPDS cards), phen (Fig 2b), and PVP (Fig 2c).

With increasing distance above 5cm, the number of beads was observed to decrease, Figs.2 (b) and (c).
However, the number of oxygen atom is not enough needed by SnO2 and Al2O3, because of which the lower binding energy of Sn3d5/2 can be explained.
All the diffraction peaks at 2θ = 26.6◦ (1 1 0), 33.9◦ (1 0 1), and 51.9◦ (2 1 1) were indexed to the tetragonal rutile SnO2 with lattice constants of a = 4.734Å and c = 3.185Å, respectively, and the values in JCPDS card (21-1250).

Results and Discussion XRD patterns in Fig.1 shows all the diffraction peaks indexed for hexagonal wurtzite structure of ZnO and the diffraction data fitted very well to the JCPDS card number 36-1451 for ZnO.
Acknowledgements The authors would like to thank Department of Materials Science and Engineering, Silpakorn University, Silpakorn University Research and Development Institute and Office of the Higher Education Commission under contract number SURDI_MUA 54/01/02 for financial support.

So the heat treated apatitic layers differ from bone-like ones in composition, number of defects and crystallite size [13].
HA peaks were occurred to 2θ of 28° and 32°, which are consistent with the standard XRD peaks for HA (JCPDS-ICDD card no 18-0303) and also tetragonal ZrO2 peaks were occurred 2θ of 35°.
Acknowledgement This study was supported by the Yıldız Technical University, Science and Technology Application and Research Center, and in part, by the Scientific Research Project Foundation within the scope of the project number is 29-07-02-KAP01.

The x-ray diffraction and x-ray photoelectron measurements revealed preferential formation of CuO for a small number of deposition cycles, while Cu2O forms preferentially for a larger number of cycles.
The TiO2 substrate exhibits a crystalline anatase TiO2 phase as indicated by the peaks labelled with A (source: JCPDS 88–1175 card).
For the sample deposited with 750 cycles, the positions and relative intensities of the B-peaks match well the pattern of the cubic Cu2O phase (source: JCPDS 05–0067 card).
The size of the copper oxide grains increases with the number of ALD cycles while, at the same time, the stoichiometry changes from predominantly CuO for small numbers of cycles to Cu2O for larger numbers.
Acknowledgments This study was funded by the project NPOO.C3.2.R2-I1.06.0083 supported by the European Union NextGenerationEU and by the University of Rijeka under the projects number 23-190 and number 23-4.

It represents a typical character of the crystalline β-Ni(OH)2 phase, which agrees well with the standard crystallographic date (JCPDS card: 14-0117).
The reason was that the electrode adsorbed a large number of the electrolyte ions when lagrge current density was used at charge/discharge.
It could not offer the ions number of the electrode charging.

From the figure, the nickel oxide prepared by experimental methods match well with international standard card JCPDS:65-2865 can be seen, position of diffraction peaks are 37.05° and 42.93°, 6.259°, its corresponding nickel oxide (111), (200), (220) crystal face respectively.
The change of the dielectric loss tangent of the nickel-coated nano-Al2O3 particles. 2 p f a = ´ (m ''e ''- m 'e ')+ (m ''e ''- m 'e ')2 + (m ''e ''+ m 'e ')2 (1) c From the above we note that, From the above, we note the reflection impedance formula of electromagnetic wave on the surface of absorbing material: Z = mr tanh æi 2p f ö in m e d (2) er ç c r r ÷ è ø The power reflection coefficient of electromagnetic wave on the primary reflection plane is obtained: é ù é ù m m (3) G = ê e r tanh (kd ) -1ú ê e r tanh (kd ) +1 ê ë r û ë r û Among them: = m '- im ",er = e '- ie '', mr k = i v (4) m r e r c The values of εr and μr for the vector dielectric constant and magnetic permeability of absorbing materials respectively; k is the complex wave number, who is also known as propagation constant; f and d are the frequencies of the
Therefore, as long as know the variables f, d, ε′, ε″, μ′, μ″ in the equation, the power reflection coefficient can be obtained : R=20 lg G (5) where ca = interface adhesion; d = friction angle at interface; and k1 = shear stiffness number.

The semicrystalline polymer PVdF posses a higher dielectric constant that assist greater dissociation of lithium salt thus providing more number of charge carriers.
The diffraction peaks located at 31.8○, 34.5○, 36.3○, 47.6○, 56.7○, 62.9○, 68.1○ and 69.1○ indexed as hexagonal wurtzite phase of ZnO (JCPDS card no: 36-1451).
The porous region are the plasticizer rich region that aids ion mobility, the film with filler has larger number of pores and micro pores capable of trapping higher plasticizer-rich phase and it is reflected in the conductivity studies.

From the Raman spectroscopy, it is found that the peak intensity of 8 modes in Bi1-xHoxFeO3 are increased and the modes shift to higher wave number.
It can be indicated that all the compounds crystallize in rhombohedral distorted perovskite structure and their corresponding Bragg reflections are indexed with R3c space group(JCPDS card 86-1518)[9].

Materials and Methods Alpha-TCP was produced on site by mixing Calcium Carbonate (Sigma-Aldrich, catalog number C4830) and Calcium Phosphate (Sigma-Aldrich, catalog number C-7263) at a 2:1 molar ratio.
Peaks were referenced with JCPDS cards 23-359 and 9-432 respectively.
Continuation of this reaction may be more influenced by the number of nucleation points releasing ions.