Paper Titles

Nanostructured Materials - Scientific Background and Technological Perspectives
p.67

Segregation to Boundaries and Interfaces in Solids
p.81

Surface/Interface X-Ray Diffraction
p.95

Characterisation of the Mechanical Properties of Thin Film Cantilevers with the Atomic Force Microscope
p.107

Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys
p.115

Interfacial Structure of a Σ9 and Defect Structure at Junctions of Σ3-Σ9-Σ3 in Diamond Film
p.121

Grain Boundary Structure in Titanium Diboride
p.129

HRTEM Study of Atomic Faceting Interfaces of Σ=3 NiSi₂/Si on (011) Si Substrate
p.135

Grain Boundaries of Finit Lenght
p.143

HomeMaterials Science ForumMaterials Science Forum Vols. 189-190Comparison of STEM and Atom Probe Methods for...

Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys

Article Preview

Abstract:

You might also be interested in these eBooks

Interfaces II

Info:

Periodical:

Materials Science Forum (Volumes 189-190)

Pages:

115-120

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.189-190.115

Citation:

Cite this paper

Online since:

July 1995

Authors:

Paul J. Warren, C.R.M. Grovenor

Keywords:

AA7150, Aluminium Alloy, Atom Probe Analysis, POSAP Analysis, STEM X-Ray Analysis

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1995 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: