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HomeMaterials Science ForumMaterials Science Forum Vols. 363-365Annealing Effects in Hydrogenated Amorphous...

Annealing Effects in Hydrogenated Amorphous Silicon Layers

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Periodical:

Materials Science Forum (Volumes 363-365)

Pages:

463-465

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.363-365.463

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Online since:

April 2001

Authors:

A. Hempel, A. Dabrowski, M. Härting, M. Hempel, D. Knoesen, W. Bauer-Kugelmann, Gottfried Kögel, Werner Triftshäuser, D.T. Britton

Keywords:

Crystallization, Electron Momentum, Hydrogenated Amorphous Silicon, Positron Lifetime, X-Ray Diffraction (XRD)

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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