Analytical Comparison of Parallel Beam and Bragg-Brentano Diffractometer Performances

Article Preview

Abstract:

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volumes 443-444)

Pages:

167-170

Citation:

Online since:

January 2004

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2004 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] L. S. Zevin and G. Kimmel: Quantitative X-ray diffractometry (Springer, New York 1995).

Google Scholar

[2] H.W. King and E.A. Payzant: Adv. X-ray Anal. Vol. 36 (1992), p.663.

Google Scholar

[3] G. Berti: Powder Diffraction Vol. 16(1) (2001), p.6.

Google Scholar

[4] R. Masciocchi and G. Artioli: Powder Diffraction Vol. 11(3) (1996), p.253.

Google Scholar

[5] M. Shuster and H. Gobel: Adv. X-ray Anal. Vol. 39 (1995), p.57.

Google Scholar

[6] S.T. Misture, S. Zdziezynski and R Smith: 47 th Annual Denver X-ray Conference, Colorado Springs, Colorado, USA, August 3-7, 1998, Abstracts, p.152.

Google Scholar

[7] R. W Cheary and J.P. Cline: Adv. X-ray Anal. Vol. 38 (1995), p.75.

Google Scholar

[8] D. Reefman: Powder Diffraction Vol. 11(2) (1996), p.107.

Google Scholar

[9] B. Verman, S. Seshadri and B. Kim: “A Simple Analytical Approach to Describe a Beam Conditioning System”, in the Proceedings of this conference.

Google Scholar