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Effects of Deformation on Electric Conductivity in Al-Zr Alloys

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Abstract:

Electric conducting behavior, sectional residual stress and texture in deformed Al-Zr alloy were investigated in order to investigate effect of deformation on electric conductance. {111} textures were developed in the wire of deformed Al-Zr alloy and most strong intensity of {111} texture was observed at the core in the cross section of the wire. Residual stress was mainly measured at the surface and , especially, measured at the core in the case of 4.5Φ wire, also, electric conductance was higher at the surface than at the core. This means that electric conductance might be affected by distribution of the residual stress.

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Periodical:

Materials Science Forum (Volumes 475-479)

Pages:

1743-1746

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.475-479.1743

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Online since:

January 2005

Authors:

Su Dong Park, Byung Geol Kim, Hee Woong Lee

Keywords:

Al-Zr Alloy, Deformation, Electric Conductivity, Residual Stress

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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References

[1] E. Nes: Acta Met. Vol. 20 (1972), p.449.

Google Scholar

[2] S. D. Park, B. G. Kim and H.W. Lee: J. Kor. Inst. Met & Mater. Vol. 39 (2001), p.381.

Google Scholar

[3] R. A. Strayer, W. Mackie, L. W. Swanson: Surf. Sci. Vol. 34 (1973), p.225.

Google Scholar

[4] H. Ishii, K. Sugiyama, E. Ito and K. Seki: Adv. Mater. Vol. 11 (1999), p.605.

Google Scholar

[5] S. H. Rhee, Thesis for doctor degree, The Univ. of Texas at Austin . (2001).

Google Scholar

[6] I. Kim: Metal and Materials Vol. 2 (1996), p.169 Wires Measured property Core Middle Surface Residual stress, σ [MPa]. -13. 6±1. 6 0 -23. 6±0. 3 4. 5Φ wire Electric resistance, R[Ω], at 25℃ 0. 270[Ω] - 0. 273[Ω] Residual stress, σ.

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