Paper Titles

Investigation of Strain in Si_1-xGe_x/Si Heterostructures and Local Isolation Structures by Convergent Beam Electron Diffraction
p.547

New Applications of Diffraction Analysis for Dislocation Structure in High Lattice-Mismatch MBE Grown Epitaxial Structures
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Detection of Threading Dislocations by EBIC in a SiGe Epilayer with Graded Buffer
p.559

HREM and DLTS of Σ37(610) and Σ29(520 )[001] Tilt Grain Boundaries in Ge Bicrystals
p.565

TEM In Situ Investigations of Interfacial Processes in the Pd/a-GeSi System
p.571

Micro-Raman Investigations of Elastic and Plastic Strain Relief in Si_1-xGe_x-Heterostructures
p.577

Raman Study of the Phonon-Plasmon Modes in the Short Period GaAs/AlAs Superlattices
p.583

Positron Annihilation on Thermal Defects in Cz-Si and Fz-Si
p.589

Characterization of MBE Grown Si/Si_1-xGe_x/Si Structures Using n⁺p-Diodes
p.595

HomeSolid State PhenomenaSolid State Phenomena Vols. 32-33TEM In Situ Investigations of Interfacial...

TEM In Situ Investigations of Interfacial Processes in the Pd/a-GeSi System

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Gettering and Defect Engineering in Semiconductor Technology V

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Periodical:

Solid State Phenomena (Volumes 32-33)

Pages:

571-576

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.32-33.571

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Online since:

December 1993

Authors:

Manfred Reiche, F. Edelman, J. Heydenreich

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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