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HomeSolid State PhenomenaSolid State Phenomena Vols. 32-33Micro-Raman Investigations of Elastic and Plastic...

Micro-Raman Investigations of Elastic and Plastic Strain Relief in Si_1-xGe_x-Heterostructures

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Gettering and Defect Engineering in Semiconductor Technology V

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Periodical:

Solid State Phenomena (Volumes 32-33)

Pages:

577-582

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.32-33.577

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Online since:

December 1993

Authors:

B. Dietrich, E. Bugiel, H.J. Osten, P. Zaumseil

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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