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HomeSolid State PhenomenaSolid State Phenomena Vol. 93Effects of Grain Boundary Structure and Chemistry...

Effects of Grain Boundary Structure and Chemistry on Electrical Activity in Polycrystalline Silicon

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Polycrystalline Semiconductors VII

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Periodical:

Solid State Phenomena (Volume 93)

Pages:

333-338

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.93.333

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Online since:

June 2003

Authors:

Sadahiro Tsurekawa, Tadao Watanabe

Keywords:

Electrical Activity, Electron Beam Induced Current (EBIC), Grain Boundary, Passivation, Silicon

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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