A Comb Driving Magnetometer Based on Tunnel Effect

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Abstract:

In this paper, a comb-driving tunneling magnetometer based on the tunneling effect is introduced. The designation, manufacture and tests of this magnetometer are discussed, including its structure, FEA analysis, machining processes and test results. The test results indicate that the chip is coincidental with the tunneling effect and the chip is capable of sensing the magnetic signal.

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Periodical:

Solid State Phenomena (Volumes 121-123)

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561-564

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Online since:

March 2007

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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[1] C. H. Liu, T. W. Kenny, A high-precision, wide-bandwidth micro machined tunneling accelerometer, in: Journal of Microeletromechanical Systems, 2001, 10(3): 425-433.

DOI: 10.1109/84.946800

Google Scholar

[2] P. G. Hartwell, F. M. Bertsch, S. A. Miller, et al, Single mask lateral tunneling accelerometer, in: Proceedings of the IEEE Micro Electro Mechanical Systems (MEMS), IEEE, 1998: 340~344.

DOI: 10.1109/memsys.1998.659779

Google Scholar

[3] R. L. Kubena, J. Vickers-kirbyd, R. J. Joyce, et al, New tunneling -based sensor for inertial rotation rate measurements, in: Sensors and Actuators, A: Physical, 2000, 83(1): 109-117.

DOI: 10.1016/s0924-4247(00)00354-x

Google Scholar

[4] T. W. Kenny, J. K. Reynolds, J. A. Podosek, et al, Micromachined infrared sensors using tunneling displacement transducers, in: The Review of Scientific Instruments, 1996, 67(1): 112-128.

DOI: 10.1063/1.1146559

Google Scholar

[5] D. DiLella , L.J. Whitman , R.J. Colton , et al. A micro-machined magnetic-field sensor based on an electron tunneling displacement transducer, in: Sensors and Actuators, A: Physical, 86(1-2), 2000: 8-20.

DOI: 10.1016/s0924-4247(00)00303-4

Google Scholar

[6] L. M. Miller, T. W. Kenny, J.A. Kovacich, et al, A μ- Magnetometer Based on Electron Tunneling, in: Proceedings 1996 IEEE- MEMSWorkshop, 467~471. Figure10 testing diagram about the tunneling current and the coil current o (A) 20. 0n IQ 2. 00n /div 0. 00 10. 0m I B ( A) 1. 00m / di v 20. 0m.

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