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Full Pattern Methods for the Analysis of Plastically Deformed Materials

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Abstract:

The recent evolution of powder diffraction line profile analysis toward full pattern methods is discussed. Specific reference is made to the Whole Powder Pattern Modelling (WPPM), as applied to metals and ceramics subjected to strong plastic deformation. Examples concerning three different materials science studies are shown to illustrate features and potentialities of the WPPM approach.

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Periodical:

Solid State Phenomena (Volume 130)

Pages:

27-32

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.130.27

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Online since:

December 2007

Authors:

Paolo Scardi, Matteo Leoni, Mirco D'Incau

Keywords:

Domain Size Distribution, Lattice Defect, Line Profile Analysis, Powder Diffraction, Whole-Powder-Pattern Modelling, X-Ray Diffraction (XRD)

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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