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Diffusion in Materials DIMAT 1996

Defect and Diffusion Forum Volumes 143 - 147

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• p1631 Microchemical Model for High Temperature Oxidation of Zirconium   [ 244 K ]
  Authors: Tony Montesin, H. Sabar, Gilles Bertrand, Marcel Berveiller
• p1637 Vacuum Arc Deposited Mo Layers: Grain Size and Roughness   [ 437 K ]
  Authors: Boris B. Straumal, N. Vershinin, V. Semenov, Vera G. Sursaeva, W. Gust
• p1645 Ab Initio Calculation of the Electromigration Wind Valence in Metals   [ 216 K ]
  Authors: J.P. Dekker, A. Lodder
• p1649 Bulk Electro- and Thermotransport in Al   [ 345 K ]
  Authors: B. Ernst, Günter Frohberg, K.H. Kraatz, H. Wever
• p1655 Bulk Electro- and Thermotransport in Nb   [ 334 K ]
  Authors: B. Ernst, Günter Frohberg, H. Wever
• p1661 Electromigration in Thin Film Conductors   [ 539 K ]
  Authors: J.R. Lloyd
• p1673 A new Insight into the Electromigration Behavior of Copper Interconnects: The Roles of Grain Boundary and Surface Diffusion   [ 325 K ]
  Authors: Evgeny E. Glickman, M. Nathan
• p1679 Field-Induced Diffusion along Grain Boundaries and Surfaces in Thin Films   [ 198 K ]
  Authors: C.L. Bauer
• p1683 Tracer Diffusion and Electrotransport in Indium-Doped Cobaltous Oxide {Co_1-xIn_x}_1-δO   [ 225 K ]
  Authors: M. Schroeder, Manfred Martin
• p1689 Mass Effect of Effective Charge of Hydrogen Isotopes in Ta   [ 200 K ]
  Authors: Kenji Hashizume, Koichi Fujii, M. Sugisaki
• p1693 Thermomigration of Zinc in Aluminium and Al-Zn Alloy   [ 295 K ]
  Authors: S.-I. Fujikawa, Y. Minamimura, T. Morikawa
• p1699 On the Effect of Superconducting Current on the Atomic Transport   [ 134 K ]
  Authors: V.A. Didik, Vitalii V. Kozlovski, R.Sh. Malkovich, E.A. Skoryatina
• p1701 Electrochemistry at Ion Conduction Microcontacts-Application to the Study of Ion Transport   [ 376 K ]
  Authors: Hans Dieter Wiemhöfer, F. Rocholl, W. Zipprich, T. Hauber, G. Reinhardt