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Textures of Materials - ICOTOM 10

Materials Science Forum Volumes 157 - 162

• Papers
• Abstracts

• p3 A Historical Survey of Texture Development between ICOTOM-1 and ICOTOM-10   [ 464 K ]
  Authors: J. Grewen
• p13 Statistical Crystallography of the Polycrystal   [ 561 K ]
  Authors: Hans Joachim Bunge
• p31 Orientation Imaging Microscopy: New Possibilities for Microstructural Investigations Using Automated BKD Analysis   [ 898 K ]
  Authors: Brent L. Adams, David J. Dingley, Karsten Kunze, Stuart I. Wright
• p43 Textures in Ceramic Materials   [ 727 K ]
  Authors: Keith J. Bowman
• p59 Texture Analysis by Neutron Diffraction   [ 545 K ]
  Authors: Heinz Günter Brokmeier
• p71 Advanced Experimental Techniques in X-Ray Texture Analysis   [ 1 M ]
  Authors: Hans Joachim Bunge, R. Grossterlinden, A. Haase, R. Ortega, Jerzy A. Szpunar, Paul Van Houtte
• p97 Quantitative Texture Analysis of Thin Polycrystalline Layers   [ 216 K ]
  Authors: G. Bermig, J. Tobisch, Kurt Helming
• p103 An Experimental Apparatus for Quantitative On-Line Texture Analysis   [ 470 K ]
  Authors: P. Blanford, Jerzy A. Szpunar
• p111 Investigation of Inhomogeneous Textures of Coatings and Near-Surface-Layers   [ 293 K ]
  Authors: Jan T. Bonarski, L. Wcislak, Hans Joachim Bunge
• p119 A New Method for Texture Measurement Based on an X-Ray Imaging Plate System   [ 306 K ]
  Authors: Heinz Günter Brokmeier, M. Ermrich
• p125 X-Ray Method for Continuous Tracking of Grain Boundary Motion: Investigation of Grain Boundary Migration in Al-Bicrystals   [ 155 K ]
  Authors: U. Czubayko, Dmitri A. Molodov, B.-C. Petersen, Günter Gottstein, Lasar S. Shvindlerman
• p131 A High-Pressure Device for In-Situ Measurements in a Neutron Beam   [ 273 K ]
  Authors: J. Heinitz, N.N. Isakov, A.N. Nikitin, W.A. Sukhoparov, K. Ullemeyer, Kurt Walther
• p137 Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality   [ 539 K ]
  Authors: Jarle Hjelen, A.H. Qvale, Ø. Gomo
• p143 A High Resolution Electron Diffraction Method for On-Line Texture Analysis   [ 441 K ]
  Authors: R. Høier, J. Bentdal, O. Daaland, Erik Nes
• p149 Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns   [ 685 K ]
  Authors: N.C. Krieger Lassen, Dorte Juul Jensen, K. Condradsen