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Textures of Materials - ICOTOM 10

Materials Science Forum Volumes 157 - 162

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• p159 Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements   [ 308 K ]
  Authors: B. Moreau, Francis Wagner, H. Göbel
• p167 Determination of Texture in CuZnAl Shape Memory Alloys in the High Temperature Austenitic Phase   [ 303 K ]
  Authors: No Jin Park, Hans Joachim Bunge
• p175 Orientation Connectivity in Polycrystals   [ 292 K ]
  Authors: Valerie Randle
• p181 High Temperature Texture Goniometer for the Measurement of Transformation Textures   [ 345 K ]
  Authors: F.R. Reher, W. Hänel, U. Czubayko, Günter Gottstein
• p187 A CCD Camera System for the Acquisition of Backscatter Kikuchi Patterns on an SEM   [ 163 K ]
  Authors: Robert A. Schwarzer
• p189 An Inexpensive CCD Camera System for the Recording and On-Line Interpretation of TEM Kikuchi Patterns   [ 357 K ]
  Authors: Robert A. Schwarzer, Stefan Zaefferer
• p195 On-Line Interpretation of SAD Channeling Patterns   [ 390 K ]
  Authors: Robert A. Schwarzer, Stefan Zaefferer
• p201 Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes   [ 489 K ]
  Authors: Robert A. Schwarzer
• p207 Equipment for Texture Measurement in Thin Films   [ 332 K ]
  Authors: Jerzy A. Szpunar, P. Blandford
• p213 Application of the Method for Non-Destructive Evaluation of Texture Heterogeneity   [ 217 K ]
  Authors: Jacek Tarasiuk, Krzysztof Wierzbanowski, Andrzej Baczmański
• p221 Influence of Texture on Backscattered Ultrasonic Noise   [ 292 K ]
  Authors: R. Bruce Thompson, K.Y. Han, I. Yalda-Mooshabad, J.H. Rose, F.J. Margetan
• p227 Characterisation of Multilayers Crystallographic Texture   [ 241 K ]
  Authors: A. Tizliouine, J. Bessières, J.J. Heizmann, J.F. Bobo
• p235 Determination of the Texture of a TiNi Shape Memory Alloy by Treatment of a Set of Overlapping Rays   [ 210 K ]
  Authors: A. Vadon, J.J. Heizmann, M. Chaoui
• p241 On-Line Determination of Deformation Systems for Cubic and Hexagonal Materials with the TEM   [ 372 K ]
  Authors: Stefan Zaefferer, Robert A. Schwarzer
• p247 On-line Interpretation of Spot and Kikuchi Patterns   [ 176 K ]
  Authors: Stefan Zaefferer, Robert A. Schwarzer