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European Powder Diffraction 3

Materials Science Forum Volumes 166 - 169

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• p237 Backscattering Monochromators for Powder Diffraction with Synchrotron Radiation   [ 250 K ]
  Authors: Thomas Wroblewski, Frank Schmidt-Hohagen
• p245 Neutron Powder Diffraction Facilities at the Laboratoire Leon Brillouin   [ 213 K ]
  Authors: T. Roisnel, Juan Rodríquez-Carvajal, M. Pinot, G. André, F. Bourée
• p251 The Polaris Powder Diffractometer at ISIS   [ 186 K ]
  Authors: R.I. Smith, S. Hull, A.R. Armstrong
• p257 Possible Utilization of High Resolution Fourier Diffractometer at Reactor IBR-2 for Strain Measurements   [ 185 K ]
  Authors: A.M. Balagurov, V.G. Simkin, Yu. V. Taran
• p261 High Precision Structural Refinement from High Resolution Fourier Neutron Powder Diffraction Data   [ 220 K ]
  Authors: A.M. Balagurov
• p267 A New Position-Sensitive Detector (PSD) for Thermal Neutrons   [ 266 K ]
  Authors: H. von Seggern, K. Schwarzmichel, T. Bücherl, C. Rausch
• p273 Modification of RTOF-Devices for Investigation in Solid State Physics and Material Science   [ 265 K ]
  Authors: U. Hartung, A. Kreyßig, V.A. Kudryashev
• p279 Characterization of Multilayers for Neutron Optics   [ 359 K ]
  Authors: H. Grimmer, P. Böni, O. Elsenhans, H.P. Friedli, K. Leifer, P.A. Buffat, I.S. Anderson
• p287 X-Ray Diffraction Investigations of Thin Gold Films   [ 123 K ]
  Authors: N. Mattern, A. Riedel, G. Weise
• p293 The Application of High Resolution X-Ray Diffraction for the Investigation of the Process of Elastic Strain Relaxation in InGaAs Quantum Well   [ 312 K ]
  Authors: N. Faleev, R. Stabenow, M. Sinitsyn, B. Yavich, A. Haase, A. Grudsky
• p299 Preparation and Properties of W/Si Multilayer X-Ray Reflectors   [ 172 K ]
  Authors: Hans Joachim Kühn, J. Kräußlich, G. Natura
• p307 Investigation of the Behaviour of Stress in Metallization Thin Films for Microelectronics during Thermal Cycling using High-Temperature X-Ray Diffraction   [ 354 K ]
  Authors: G.M. Zorn, M. Schneegans
• p313 X-Ray Diffraction Studies and Ellipsometric Diagnostics of Thin α-Ti Growth Films in Plasma Activated Physical Vapour Deposition   [ 219 K ]
  Authors: Harm Wulff, H. Steffen, V. Krasemann, J. Klimke
• p319 An X-Ray Study of Thermally-Sprayed Metal Coatings   [ 301 K ]
  Authors: I. Iordanova, K.S. Forcey, J. Valtcheva, B. Gergov
• p325 Characterization by XRPD of Diamond Films Grown on Titanium   [ 194 K ]
  Authors: G. Cappuccio, V. Sessa, M.L. Terranova, C. Veroli