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Articles by author: Andreas Magerl

• [01-15] Grown 6H-SiC Bulk Crystals Investigated by High Energy Triple Axis X-Ray Diffraction
  Published in: Silicon Carbide and Related Materials 2004 (p307)
• In Situ Observation of Oxygen Precipitation in Silicon with High Energy X-Rays
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p437)
• In Situ Observation of Polytype Switches during SiC PVT Bulk Growth by High Energy X-Ray Diffraction
  Published in: Silicon Carbide and Related Materials 2008 (p23)
• 6H-SiC Crystals Grown in [015] and [001] Directions Characterized by High Energy Triple-Axis X-Ray Diffraction
  Published in: Silicon Carbide and Related Materials 2006 (p219)
• High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals
  Published in: Silicon Carbide and Related Materials - 2002 (p289)
• In Situ X-Ray Measurements of Defect Generation during PVT Growth of SiC
  Published in: Silicon Carbide and Related Materials 2006 (p267)
• In-Situ Er-Doping of SiC Bulk Single Crystals
  Published in: Silicon Carbide and Related Materials 2003 (p723)
• Natural Crystal Habit and Preferential Growth Directions during PVT of Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2003 (p111)
• Observation of Lattice Plane Bending during SiC PVT Bulk Growth Using In Situ High Energy X-Ray Diffraction
  Published in: Silicon Carbide and Related Materials 2009 (p29)
• Structural Defects in SiC Crystals Investigated by High Energy X-Ray Diffraction
  Published in: Silicon Carbide and Related Materials 2003 (p339)
• The Build-Up of Strain Fields in Czochralski-Si Observed in Real Time by High Energy X-Ray Diffraction
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p631)
• Thermal Expansion Coefficients of 6H Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2007 (p517)
• X-Ray Diffraction Line Profile Analysis of Neutron Irradiated 6H-SiC
  Published in: Silicon Carbide and Related Materials 2000 (p287)