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Articles by author: Boris A. Andreev

• "New Donors" in Czochralski Grown Silicon Annealed at T≥ 600°C under Compressive Stress
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p181)
• Contactless Photothermal Ionization Spectroscopy of Shallow Defects in Semiconductors
  Published in: Defects in Semiconductors 17 (p1365)
• Copper Species in Ultra-Pure Germanium Crystals
  Published in: Defects in Semiconductors 18 (p701)
• Donor Centers in Er-Implanted Silicon
  Published in: Defects in Semiconductors 19 (p1515)
• Electron Mobility in Moderately Doped Si_1-xGe_x
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p31)
• Impact of Compressive Stress on the Formation of Thermal Donors in Heat-Treated Silicon
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p259)
• Oscillator Strengths and Linewidths of Shallow Impurity Spectra in Si and Ge
  Published in: Defects in Semiconductors 18 (p121)
• Photo-Induced and Thermally Stimulated Degredation in a-Si:H : Mechanism of Defect Creation
  Published in: Polycrystalline Semiconductors III (p393)
• Photoluminescence of Erbium-Doped Silicon: Temperature Dependence
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p359)
• Thermal Donors in Silicon Doped with Erbium
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p207)
• Thermal Donors in Silicon Implanted with Rare Earth Impurities
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p93)