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Articles by author: E. Susi

• B-Ion Implantation into Mo-Film for Shallow Junction Formation: DLTS Analyses on the p⁺/n Fabricated Diodes
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p505)
• Characterisation of Surface and Near-Surface Regions in High-Purity Cz Si
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p747)
• Conventional and Rapid Thermal Annealing Induced Defects in Czochralski Silicon
  Published in: Defects in Semiconductors 15 (p213)
• Effects of Rapid Thermal Annealing Treatments on Electrical and Structural Properties of Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p187)
• Electrical Characterization of As-Grown and Thermally Treated 8'' Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p143)
• Investigation of Stacking Faults in Silicon by Induced Current Methods
  Published in: Defects in Semiconductors 15 (p1295)
• Surface Damage Induced by Reactive Ion Etching in n- Type Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p383)