Papers by Author: E. Susi

Paper TitlePage

Characterisation of Surface and Near-Surface Regions in High-Purity Cz Si
Authors: Antonio Castaldini, Daniela Cavalcoli, Anna Cavallini, T. Minarelli, E. Susi
747
Electrical Characterization of As-Grown and Thermally Treated 8'' Silicon Wafers
Authors: Antonio Castaldini, Daniela Cavalcoli, Anna Cavallini, Sergio Pizzini, E. Susi
143
Surface Damage Induced by Reactive Ion Etching in n- Type Silicon
Authors: Antonella Poggi, E. Susi
383
B-Ion Implantation into Mo-Film for Shallow Junction Formation: DLTS Analyses on the p+/n Fabricated Diodes
Authors: Antonella Poggi, R. Angelucci, E. Susi, M. Merli
505
Effects of Rapid Thermal Annealing Treatments on Electrical and Structural Properties of Silicon
Authors: E. Susi
187
Investigation of Stacking Faults in Silicon by Induced Current Methods
Authors: Antonio Castaldini, Anna Cavallini, Antonella Poggi, E. Susi
1295
Conventional and Rapid Thermal Annealing Induced Defects in Czochralski Silicon
Authors: E. Susi, Antonella Poggi, R. Fabbri, Giorgio Lulli, A.G. Adegboyega
213
Showing 1 to 7 of 7 Paper Titles