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Articles by author: Erich Kasper

• Equilibrium Configuration of Misfit Dislocations in Graded Buffers
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p457)
• Future Material Systems: Requirements and Applications
  Published in: Advances in Electronic Materials (p17)
• Interaction between Point Defects and Dislocations in SiGe
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p179)
• Room Temperature Direct Band-Gap Emission from an Unstrained Ge P-I-N LED on Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p25)
• Si/Ge - Heterostructures - Stability of Strained Layer Superlattices
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p573)
• Silicon Based Heterostructures: Advances in Channel Materials
  Published in: Advances in Electronic Materials (p27)
• Strained Silicon on Ultrathin Silicon-Germanium Virtual Substrates
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p463)
• Study of Relaxed Si_0.7Ge_0.3 Buffers, Grown on Patterned Silicon Substrates, by Raman Spectroscopy
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p539)
• Thin SiGe Relaxed Buffer for Strain Adjustment
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p797)
• Today’s Mainstream Microelectronics - A Result of Technological, Market and Human Enterprise
  Published in: Advances in Electronic Materials (p1)
• X-Ray Triple Crystal Diffractometry of Structural Defects in Si_mGe_n Superlattices
  Published in: Defects in Semiconductors 17 (p1325)