HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by author: Erwan Oliviero

• A New Approach to Study the Damage Induced by Inert Gases Implantation in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p357)
• Cavities in He-Implanted SiC
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p533)
• Cavity Formation in Helium-Implanted Silicon - Temperature Dependence
  Published in: Defects and Diffusion in Semiconductors (p37)
• Contribution of X-Ray Diffraction Simulations to Experimental Study of High Energy He Implantation at High Dose in 4H-SiC at Room Temperature
  Published in: Silicon Carbide and Related Materials 2003 (p937)
• Defects Created by Helium Implantation at Different Temperatures in Silicon
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p285)
• Use of Graphite Cap to Reduce Unwanted Post-Implantation Annealing Effects in SiC
  Published in: Silicon Carbide and Related Materials 2006 (p611)