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Articles by author: I. El Harrouni

• Application of UV Scanning Photoluminescence Spectroscopy for Minority Carrier Lifetime Mapping
  Published in: Silicon Carbide and Related Materials - 2002 (p349)
• Characterization of Homoepitaxial 4H-SiC Layer Grown from Silane/Propane System
  Published in: Silicon Carbide and Related Materials - 2002 (p165)
• Epitaxial Growth of 4H-SiC with Hexamethyldisilane HMDS
  Published in: Silicon Carbide and Related Materials 2001 (p263)
• Investigation of Defects in 4H-SiC by Synchrotron Topography, Raman Spectroscopy Imaging and Photoluminescence Spectroscopy Imaging
  Published in: Silicon Carbide and Related Materials - 2002 (p265)
• Optical Characterization of Full SiC Wafer
  Published in: Silicon Carbide and Related Materials 2003 (p593)