Articles by author: I. Tomov

Accounting for Secondary Extinction in Thickness Measurement of Thin Films by X-Ray Absorption
Published in: Textures of Materials - ICOTOM 14 (p99)
Anisotropy of Secondary Extinction Coefficient in Textured Films
Published in: European Powder Diffraction EPDIC 7 (p192)
Application of the Monte Carlo Method to Fiber Texture of Electrolytically Deposited Ni Films
Published in: European Powder Diffraction 6 (p417)
Influence of Oxygen on the Development of Texture and Grain Morphology in Polycrystalline Al Thin Films
Published in: Nonequilibrium Materials (p207)
Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction
Published in: Texture and Anisotropy of Polycrystals (p145)
Single Reflection Method for Pole-Density Measurements Accounting for Secondary Extinction in Textured Films
Published in: European Powder Diffraction EPDIC 8 (p141)
Texture and Secondary Extinction of Vacuum Deposited Ag Films
Published in: European Powder Diffraction 6 (p400)
Texture Evolution in Stratified Al Thin Films
Published in: Structure Development in Condensed Matter (p213)
Thickness Measurement of Thin Textured Films by a Novel X-Ray Diffraction Method Accounting for Secondary Extinction
Published in: APPLIED CRYSTALLOGRAPHY XX (p43)
X-Ray Diffraction Characterization of Textured Films Accounting for Secondary Extinction
Published in: European Powder Diffraction 6 (p137)
X-Ray Diffraction Method for Monitoring of Texture Evolution in Layers
Published in: European Powder Diffraction (p175)
X-Ray Diffraction Study of Texture Evolution in Electrodeposited Zinc Layers
Published in: Textures of Materials - ICOTOM 10 (p1495)