Papers by Author: I. Tomov

Abstract: Accounting for secondary extinction (SE) of the intensities measured from a textured film by means of conventional X-ray diffractometer, a new X-ray diffraction method is described for determination of film thickness. Physically, the problem is restricted to using a reflection pair corresponding to the main component of the texture. As model sample a vacuum-deposited silver thin film is used.

Abstract: Allowing for secondary extinction (SE), a method is described for thickness measurement of thin films by x-ray absorption. The method is tested by employing Al foils and electrodeposited Cu films detached by the substrate. The thicknesses determined by the method were in fair agreement with that ones measured by the ordinary absorption method based on using incident beam intensities. Moreover, a dependence of the SE coefficient on the transmission factor of the films was experimentally shown, and thus additional light was thrown on the nature of SE.

Abstract: A method of pole density measurements is described, which uses the differences in X-ray beam polarisation of two monochromators. The method requires a single reflection at an intermediate diffraction angle. Experimental verification is provided by pole density measurements of Ag films and comparison the results obtained with the proposed method with results from the reflection-pair method [8-10].