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Articles by author: Ida E. Tyschenko

• Blue-Green Photoluminescence from Silicon Dioxide Films Containing Ge⁺ Nanocrystals Formed under Conditions of High Hydrostatic Pressure Annealing
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p607)
• Carrier Accumulation in Silicon-On-Insulator Structures Containing Ge Nanocrystals in the Burried SiO₂ Layer
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p77)
• Crystallization of InSb Phase Near the Bonding Interface of Silicon-on-Insulator Structure
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p137)
• Recrystallization of Silicon on Insulator Layers Implanted with High Doses of Hydrogen Ions
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p23)
• SiGe Heterostructures-on-Insulator Produced by Ge⁺-Ion Implantation and Subsequent Hydrogen Transfer
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p143)
• Solid State Transitions Investigations in DAC by Spectroscopy Methods
  Published in: High Pressure Effects in Chemistry, Biology and Materials Science (p315)
• Structural and Photoluminescence Properties of H⁺ Ion-Implanted Silicon-on-Insulator Structures Formed by Hydrogen Slicing
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p509)
• The Properties of Hydrostatically Strained Ge and Si Nanocrystals in Silicon Dioxide Matrix
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p39)
• Visible Light-Emitting Hydrogenated Nanocrystalline Silicon-on-Insulator Films: Formation and Properties
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p453)
• Visible Photoluminescence from Germanium-Implanted Silicon Oxynitride Films after Annealing under Hydrostatic Pressure
  Published in: Defects and Diffusion in Ceramics (p71)
• Сavity Effect in Hydrogen Ion Implanted Silicon-On-Insulator Structures
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p477)